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ФЕТТ - Електроника - 47

Информация за рефератите по КНЕА

КНЕА

Тема на реферата на група 42: Надеждност

Материал за подготовка: 19065653-Reliability-for-Begineers.pdf

Пореден №	Фак. №	Подтема	Стр. от-до	Изрегли в желания формат
1	101207100	A Brief Introduction to Probability Theory and Statistics	11-16	REL-01.doc REL-01.ppt
2	101207015	Statistical Distributions used in Reliability Analysis	16-23	REL-02.pdf REL-02.ppt
3	101207151	The Log-Normal Distribution	23-29	REL-03.pdf REL-03.ppt
4	101207138	Burn-In - Introduction	31-36	REL-04.doc REL-04.ppt
5	101206036	Burn-In Documents	36-40	REL-05.pdf REL-05.ppt
6	101207093	Reliability after Burn-In	40-48	REL-06.doc REL-06.ppt
7	101207056	A Physics- Of – Failure Approach to Burn –In	48-51	REL-07.doc REL-07.ppt
8	101207113	MIL-HDBK-217 vs. HALT/HASS	53-58	REL-08.doc REL-08.ppt
9	101206051	A New System-Reliability Assessment Methodology	59-68	REL-09.doc REL-09.ppt
10	101207057	Initial Assessment	68-74	REL-10.doc REL-10.ppt
11	101207007	Reliability Design Improvement Methods	77-85	REL-11.doc REL-11.ppt
12	101207025	Cost Analysis	87-94	REL-12.doc REL-12.ppt
13	101207014	Warranty Cost Analysis	94-96	REL-13.doc REL-13.ppt
14	101207003	Accelerated Life Testing Data Analysis	97-104	XXX-00.pdf XXX-00.ppt
15	101207072	How do you fit an acceleration model?	104-109	REL-15.doc REL-15.ppt
16	101207077	How to fit an Arrhenius Model with Graphical Estimation	113-118	XXX-00.pdf XXX-00.ppt
17	101206014	Illustrating the MLE Method Using the Normal Distribution	118-121	REL-17.doc REL-17.ppt
18	101206094	Examples of Reporting for Parametric Data Analysis	122-127	REL-18.doc REL-18.ppt
19	101207024	Electronic Devices Example	127-134	REL-19.rtf XXX-00.ppt
20	101207154	Highly Accelerated Testing	137-142	XXX-00.pdf XXX-00.ppt
21	101207110	Equipments Required	142-146	REL-21.pdf REL-21.ppt
56	101207111	Reliability Standards & Handbooks	307-313	REL-56.doc REL-56.ppt
57	101207116	MIL-STD-2074 Failure Classification for Reliability Testing	313-321	XXX-00.pdf XXX-00.ppt
		Материали : S09_05_conductive_atomic_force_microscopy_application.pdf
1	101207103	Conductive Atomic Force Microscopy Application for Semiconductor Failure Analysis in Advanced Nanometer Process	1-4	CAF-01.doc CAF-01.ppt

Когато сте готови с рефератите, ми ги изпратите на e-mail d.m.iliev@gmail.com Важно е файловете които ми изпращате да са в стандартни формати: *.ppt , *.doc , *.rtf , *.pdf

Имената на файловете образувайте по следния начин: REL-XX_ YYY.rtf и RELXX_YYY.pdf или SPC-XX_YYY.rtf и SPC-XX_YYY.pdf, в зависимост от това кой материал ползвате, като XX- означава поредния ви номер , а YYY – вашите инициали (първите букви на трите ви имена), записани с главни латински букви.